Pre-congress Workshops
**Organized by the Pre-congress Workshops Committee**
Saturday, 9th September 2023 (Off-site) |
Full-day 09:00-17:30
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Half-day (morning) 09:00-12:30
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Half-day (afternoon) 14:00-17:30
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Sunday, 10th September 2023 (BEXCO) |
Full-day 09:00-17:30
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Half-day (morning) 09:00-12:30
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Half-day (afternoon) 14:00-17:30
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IMC20 will provide technical workshops ahead of the congress, aiming at disseminating and discussing the microscopy techniques, and expanding professional networking between the attendees. Interesting and timely subjects will be conducted by leading experts, providing an in-depth review of state-of-the-art current technology in each field and appropriate methods of assessing image quality and machine performance.
Most workshops with theory lectures or computer labs will be held in BEXCO in Busan, while some on-site workshops are also provided in other cities for practical experiments using the equipment.
Registration
Type | Half-day Workshops | Full-day Workshops |
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Open from 28 Feb. 2023 |
USD 70 per person
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USD 150 per person
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* Pre-congress Workshops require a separate registration from the IMC20 as it is an additional program. It does not include entry rights to the exhibition, congress symposia, and other social events.
Conditions of Payment
<Credit Card>
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VISA, MASTER, and JCB CARDS are the only acceptable types of credit cards to pay. Participants wishing to make the payment with their credit card must settle online.
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Participants can make the online payment on any browser settings if WINDOWS. Other PC environments such as MAC OS, cannot receive online payments due to security systems collision.
<Bank Transfer>
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Please be informed that the fee must be transferred under the registrant’s name.
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Any surcharges or remittance fees incurred to make the transfer should be paid by the registrants.
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A Copy of the transfer from the bank must be sent to the secretariat (preworkshop@imc20.kr).
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Please transfer to the bank details below.
Account Holder |
Korean Society of Microscopy
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Address of Account Holder |
26, Gukjegeumyung-ro 8-gil, Yeongdeungpo-gu, Seoul, Korea
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Account Number |
065901-04-164278
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Name of Bank |
KOOKMIN BANK
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Swift Code |
CZNBKRSE or CZNBKRSEXXX
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Confirmation (Receipt of Payment)
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You will receive a confirmation email upon completion of the registration to our congress.
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You may also download a copy of the receipt from ‘My Page’.
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Please note you can only download the confirmation receipts once your payment has been confirmed by the secretariat.
Cancellation & Refund
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For any refunds must be requested within 7 days from the date of payment.
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Before 31 July : 100% Refund (NO Penalty Charge)
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From 1 August : Non-refundable (100% Penalty Charge)
Pre-congress Workshops Enquiry
E-mail : preworkshop@imc20.kr
Detailed Program
1
BEXCO Workshops
10 September (Sun.), Full-day Workshop 10:00-17:20, BEXCO
Electron probe microanalysis (EPMA) is a technique widely used for the microanalytical characterization of solid-materials. Since EPMA has various capabilities not only for the quantitative analysis but also for the two dimensional mapping analysis, EPMA has been an popular and essential tools for the research by many material scientists in these days. This workshop will deal with topics from the fundamentals, applications, the current merits and limitations of this technique.
[Topics of Interest]
• Fundamentals of Electron Probe Micro Analysis (EPMA)
• Toward the precise numbers: several factors to be considered for quantitative analysis
• Lower detection limits of EPMA: how small concentration can be measured?
• Application of Mapping analysis: practical guidelines for EPMA's 2D elemental distribution
[Topics of Interest]
• Fundamentals of Electron Probe Micro Analysis (EPMA)
• Toward the precise numbers: several factors to be considered for quantitative analysis
• Lower detection limits of EPMA: how small concentration can be measured?
• Application of Mapping analysis: practical guidelines for EPMA's 2D elemental distribution
Organizer : Keewook Yi
(Korea Basic Science Institute, Republic of Korea)
Organizer : Changkun Park
(Korea Polar Research Institute, Republic of Korea)
Workshop Program
Program Outline | ||||
10:00 - 11:30 | Session 1 | |||
Invited Speaker 1 | Keewook | YI | Korea Basic Science Institute, Republic of Korea | Fundamentals of Electron Probe Micro Analysis (EPMA) |
11:30 - 13:00 | Lunch | |||
13:00 - 14:00 | Session 2 | |||
Invited Speaker 1 | Keewook | YI | Korea Basic Science Institute, Republic of Korea | Toward the precise numbers: several factors to be considered for quantitative analysis |
14:00 - 15:00 | Session 3 | |||
Invited Speaker 2 | Takenori | KATO | Nagoya University, Japan | Lecture on quantitative EPMA of trace elements (video lecture) |
15:00 - 15:20 | Coffee Break | |||
15:20 - 17:20 | Session 4 | |||
Invited Speaker 3 | Changkun | Park | Korea Polar Research Institute, Republic of Korea | X-ray elemental mapping using EPMA: Practical guidelines for data acquisition and processing |
10 September (Sun.), Full-day Workshop 09:00-17:30, BEXCO
Electron Energy-Loss Spectroscopy (EELS) is a valuable tool used by researchers to explore the electronic and structural properties of materials at the nanoscale. EELS has been widely used to provide insights on the thickness of materials, obtain chemical composition, and reveal oxidation state and bonding properties of elements. Recent advancements in instrumentation and knowledge of electron-sample interactions have expanded the scope of what can be obtained with EELS, including magnetic and optical properties, molecular vibrations, phonon dispersions, and isotopic detection. This workshop will delve into the foundational principles of EELS and introduce how it can be applied to a broad range of material properties. New data analysis techniques will also be covered. Participants can expect to gain a deeper understanding of EELS and its applications in various fields of materials science. Overall, this workshop presents an excellent opportunity for students and researchers to broaden their knowledge of this powerful technique.
[Topics of Interest]
• Fundamental concepts of EELS,
• EELS applied to the “daily” life of material scientists
• Monochromated EELS applied to optical properties of materials
• EELS used in cryogenic, pyrogenic, and liquid environments.
[Topics of Interest]
• Fundamental concepts of EELS,
• EELS applied to the “daily” life of material scientists
• Monochromated EELS applied to optical properties of materials
• EELS used in cryogenic, pyrogenic, and liquid environments.
Organizer : Juan Carlos Idrobo
(University of Washington, USA)
10 September (Sun.), Half-day Workshop 09:00-12:30, BEXCO
Atom probe tomography (APT) delivers accurate three-dimensional chemical analysis at a high level of sensitivity for all elements irrespective of their mass and compositions. For instance, imaging hydrogen and lithium inside structural/energy materials with atom probe microscopy have already been studied widely, and this is likely to become even more powerful.
In recent years, with the development of an environmental transferring system and adapted cryogenic preparation protocols, the field of frozen solid-liquid-gas has been opened unravelling structural and chemical evolution of solid-liquid-gas interface. The workshop will bring together leading scientists in atom probe microscopy and related technologies to address important challenges in cryogenic APT experiment particularly sample preparations for high-resolution imaging. This is a forum where experts share their approaches and views and engage in in-depth discussions to resolve challenges and issues.
[Topics of Interest]
• cryo-perservation, instrument advances, and sample preparation/stability
• reconstruction and data analysis of soft matters (frozen liquid, organics, gas-charged materials)
• chemical and cryogenic fixation approaches and cryogenic focused ion beam milling
In recent years, with the development of an environmental transferring system and adapted cryogenic preparation protocols, the field of frozen solid-liquid-gas has been opened unravelling structural and chemical evolution of solid-liquid-gas interface. The workshop will bring together leading scientists in atom probe microscopy and related technologies to address important challenges in cryogenic APT experiment particularly sample preparations for high-resolution imaging. This is a forum where experts share their approaches and views and engage in in-depth discussions to resolve challenges and issues.
[Topics of Interest]
• cryo-perservation, instrument advances, and sample preparation/stability
• reconstruction and data analysis of soft matters (frozen liquid, organics, gas-charged materials)
• chemical and cryogenic fixation approaches and cryogenic focused ion beam milling
Organizer : Pyuck-Pa Choi
(Korea Advanced Institute of Science and Technology, Republic of Korea)
Organizer : Se-Ho Kim
(Korea University, Republic of Korea)
Workshop Program
Program Outline | ||||
09:00 - 10:30 | Session 1 | |||
Invited Speaker 1 | Ayman | El-Zoka | Imperial College London, U.K. | (TBA) |
Invited Speaker 2 | Stephan | Gerstl | ETH Zurich, Switzerland | (TBA) |
Invited Speaker 3 | Leigh | Stephenson | The University of Sydney, Australia | (TBA) |
10:30 - 11:00 | Coffee Break | |||
11:00 - 12:30 | Session 2 | |||
Invited Speaker 4 | Eric | Woods | Max-Planck-Institut für Eisenforschung, Germany | (TBA) |
Invited Speaker 5 | Daniel | Perea | Pacific Northwest National Laboratory, U.S. | (TBA) |
10 September (Sun.), Full-day Workshop 09:00-17:30, BEXCO
Many novel materials processes that are critical to the development of renewable energy systems, quantum materials and advanced healthcare solutions, occur on atomic length and time scales. These are exactly the observation scales that are accessible by modern electron microscopes and with the recent development of commercially available in-situ holders, operando experiments have become possible in many locations around the world. However, despite the growing ease of experimental access, there are many easily overlooked requirements that make the generation of reliable, reproducible and quantitative data very challenging. In this workshop we bring together leaders in in-situ microscopy to delve into the precise controls needed to understand how to set up a microscope and perform quantitative experimental observations using 3 of the most common types of in-situ stages – biasing, gases and liquids. The workshop will cover all practical considerations and common mistakes for each type of experiment and provide participants with a guideline to performing their own state-of-the-art experiments.
[Topics of Interest]
• Dose Control and Signal/Noise Issues for In-situ EM
• The Fundamental Control |Parameters for In-situ heating/Biasing
• Measuring and Controlling Gas Reactions in the SEM/TEM/STEM
• From Assembling Liquid cells to Quantitative Electrochemistry Experiments
[Topics of Interest]
• Dose Control and Signal/Noise Issues for In-situ EM
• The Fundamental Control |Parameters for In-situ heating/Biasing
• Measuring and Controlling Gas Reactions in the SEM/TEM/STEM
• From Assembling Liquid cells to Quantitative Electrochemistry Experiments
Organizer : Marc Willinger
(TU-Munich, Germany)
Organizer : Nigel Browning
(University of Liverpool, UK)
Workshop Program
Program Outline | ||||
09:00 - 10:30 | Session 1 | |||
Invited Speaker 1 | Nigel | Browning | University of Liverpool, UK | Dose Control for Quantitative, Reproducible In-situ Measurements |
10:30 - 11:00 | Coffee Break | |||
11:00 - 12:30 | Session 2 | |||
Invited Speaker 1 | (TBD) | In-situ Mechanical and Electrical Testing | ||
12:30 - 14:00 | Lunch | |||
14:00 - 15:30 | Session 3 | |||
Invited Speaker 1 | Marc | Willinger | TU-Munich, Germany | Practical Approaches to In-situ Gas Observations |
15:30 - 16:00 | Coffee Break | |||
16:00 - 17:20 | Session 4 | |||
Invited Speaker 1 | Layla | Mehdi | University of Liverpool, UK | In-situ Measurements in Liquids |
10 September (Sun.), Full-day Workshop 09:00-17:30, BEXCO
Artificial Intelligence (AI) and machine learning (ML) methods have become widely used across virtually all sectors of society. In this tutorial, we will focus on an introduction to AI/ML Methods as applicable to microscopy data, from electron and scanning probe microscopy generally. The day will start with an introduction to common methods and challenges associated with application of AI/ML algorithms to microscopy. Then we will cover image and spectral methods for better understanding spectroscopic datasets, e.g. from STEM-EELS or from hysteresis curves, etc. Finally, the workshop will focus on the use of deep learning methods for structure-property relationships, including the use of variational autoencoders and methods to add invariances for more physically-interpretable latent space representations. Finally, the workshop will conclude with a vision for use of AI/ML towards autonomous microscopy systems as physics discovery platforms.
[Topics of Interest]
• machine learning
• spectral processing
• image processing
• physics extraction
• autoencoders
[Topics of Interest]
• machine learning
• spectral processing
• image processing
• physics extraction
• autoencoders
Organizer : Rama Vasudevan
(Oak Ridge National Laboratory, USA)
Organizer : Yunseok Kim
(Sungkyunkwan University, Republic of Korea)
Workshop Program
Program Outline | ||||
09:00 - 10:30 | Session 1 : Intro to ML | |||
Chair | Yunseok | Kim | Sungkyunkwan University, Republic of Korea | |
Invited Speaker 1 | Rama | Vasudevan | Oak Ridge National Laboratory, USA | Introduction to machine learning in microscopy |
10:30 - 11:00 | Coffee Break | |||
11:00 - 12:30 | Session 2 : Image and spectral analytics | |||
Chair | Ayana | Ghosh | Oak Ridge National Laboratory, USA | |
Invited Speaker 1 | Joshua | Agar | Drexel University, USA | Image and Spectral Analytics for Microscopy |
Invited Speaker 2 | Rama | Vasudevan | Oak Ridge National Laboratory, USA | Spectral fitting and processing |
12:30 - 14:00 | Lunch | |||
14:00 - 15:30 | Session 3 : Deep Learning and casual ML | |||
Chair | Yunseok | Kim | Sungkyunkwan University, Republic of Korea | |
Invited Speaker 1 | Joshua | Agar | Drexel University, USA | Deep learning: introduction and applications to microscopy |
Invited Speaker 2 | Ayana | Ghosh | Oak Ridge National Laboratory, USA | Advanced machine learning and causal ML |
15:30 - 16:00 | Coffee Break | |||
15:20 - 17:20 | Session 4 : Automated/autonomous future | |||
Chair | Rama | Vasudevan | Oak Ridge National Laboratory, USA | |
Invited Speaker 1 | Segei | Kalinin | University of Tennessee, USA | Automated and autonomous microscopy |
Invited Speaker 2 | Ayana | Ghosh | Oak Ridge National Laboratory, USA | Hypothesis Learning for autonomous physics discovery |
10 September (Sun.), Full-day Workshop 10:00-17:30, BEXCO
Many experiments in scanning / transmission electron microscopy (S/TEM) collect an enormous amount of data, due to the widespread adoption of high speed direct electron detectors. These include in situ time series, tilt series for 3D tomography, spectroscopy data such as STEM-EELS, and four dimensional STEM (4D-STEM) diffraction experiments. As a result, we require fast and efficient software codes to analyze these large datasets. This workshop will provide an overview of open source python tools for analysis of atomic resolution imaging, spectroscopic, and diffraction datasets. In this workshop, we will direct participants through hands-on python tutorials and provide example datasets for analysis of 4D-STEM experiments using py4DSTEM. We will also explain the principles behind simulation of TEM and STEM experiments, and lead participants through tutorials of the abTEM and Prismatic simulation programs.
[Topics of Interest]
• Overview of analysis of imaging, diffraction, and spectroscopy TEM experiments with python.
• py4DSTEM analysis of 4D-STEM, including strain, orientation, DPC, and ptychography.
• Simulation of diffraction patterns with py4DSTEM.
• Simulation of atomic resolution STEM experiments with Prismatic.
• Simulation of atomic resolution TEM experiments with abTEM.
[Topics of Interest]
• Overview of analysis of imaging, diffraction, and spectroscopy TEM experiments with python.
• py4DSTEM analysis of 4D-STEM, including strain, orientation, DPC, and ptychography.
• Simulation of diffraction patterns with py4DSTEM.
• Simulation of atomic resolution STEM experiments with Prismatic.
• Simulation of atomic resolution TEM experiments with abTEM.
Organizer : Colin Ophus
(Lawrence Berkeley National Laboratory, USA)
Workshop Program
Program Outline | ||||
10:00 - 10:30 | Session 1 | |||
Invited Speaker 1 | Colin | Ophus | Lawrence Berkeley National Laboratory, USA | Introduction to computer analysis of TEM |
Invited Speaker 2 | Stephanie | Ribet | Lawrence Berkeley National Laboratory, USA | Introduction to python and jupyter |
Invited Speaker 3 | Colin | Ophus | Lawrence Berkeley National Laboratory, USA | Computational image analysis of 2D data |
Invited Speaker 4 | Stephanie | Ribet | Lawrence Berkeley National Laboratory, USA | Computational image analysis of 3D data |
10:30 - 11:00 | Coffee Break | |||
11:00 - 12:30 | Session 2 | |||
Invited Speaker 1 | Colin | Ophus | Lawrence Berkeley National Laboratory, USA | Introduction to 4D-STEM and py4DSTEM |
Invited Speaker 2 | Stephanie | Ribet | Lawrence Berkeley National Laboratory, USA | 4D-STEM strain mapping |
Invited Speaker 3 | Colin | Ophus | Lawrence Berkeley National Laboratory, USA | 4D-STEM orientation and phase mapping |
Invited Speaker 4 | Stephanie | Ribet | Lawrence Berkeley National Laboratory, USA | Diffraction simulation in py4DSTEM |
12:30 - 14:00 | Lunch | |||
14:00 - 15:30 | Session 3 | |||
Invited Speaker 1 | David | Muller | Cornell University, USA | Detectors in 4D-STEM |
Invited Speaker 2 | David | Muller | Cornell University, USA | Introduction to ptychography and phase contrast |
Invited Speaker 3 | Colin | Ophus | Lawrence Berkeley National Laboratory, USA | Phase contrast reconstrucitons in py4DSTEM |
15:30 - 16:00 | Coffee Break | |||
16:00 - 17:30 | Session 4 | |||
Invited Speaker 1 | David | Muller | Cornell University, USA | Introduction to simulation for TEM and STEM |
Invited Speaker 2 | Stephanie | Ribet | Lawrence Berkeley National Laboratory, USA | Using the abTEM simulation code |
10 September (Sun.), Full-day Workshop 09:00-17:30, BEXCO
Many functional materials and devices inherently possess 3D structures, which often contain interfaces, surfaces, voids and defects at different lengthscales ranging from microns to atomic levels. Since the materials and device properties can strongly be influenced by these complex 3D structures, electron tomography has been widely used as a tool for exploring the morphologies, compositions and physical properties of materials in 3D. Recently, with the aid of rapidly evolving electron optics and detector technology as well as advanced reconstruction algorithms, the electron tomography technique has achieved enhanced spatiotemporal resolution with multi-dimensional modalities from 4D-STEM capabilities and spectroscopic tools. This symposium invites contributions that address the forefront development of tomography techniques in hardware and software aspects, together with recent achievements based on these techniques.
[Topics of Interest]
• Electron tomography in atomic resolution
• Tomography combined with spectroscopy: EDS and EELS tomography
• Tomography based on ptychography
• Development of novel hardware and algorithms for electron tomography
• 3D structure and related materials property characterizations based on electron tomography
[Topics of Interest]
• Electron tomography in atomic resolution
• Tomography combined with spectroscopy: EDS and EELS tomography
• Tomography based on ptychography
• Development of novel hardware and algorithms for electron tomography
• 3D structure and related materials property characterizations based on electron tomography
Organizer : Yongsoo Yang
(Korea Advanced Institute of Science and Technology, Republic of Korea)
10 September (Sun.), Half-day Workshop 09:00-12:30, BEXCO
The central quantities of interest in materials and life science microscopy leave their fingerprint in the phase of the electron wave. Since the phase gets lost during the recording, the development of phase retrieval and phase contrast techniques is key to map electric fields, magnetic induction and the structure of weakly scattering objects. In the last decade, 4D-STEM imaging as the natural evolution of differential phase contrast (DPC) imaging has proven highly versatile to retrieve electrical and magnetic properties, to achieve superresolution and to invert multiple scattering in specimens. This workshop first introduces to the experimental details of 4D STEM incl. data recording, interpretation and processing. In particular, the design of virtual detectors for angular multi-range analysis, centre-of-mass imaging and DPC is explained by means of practical examples. Second, the workshop addresses the inverse problem and introduces to several concepts of phase retrieval using ptychographic concepts. In that respect, reconstruction schemes are presented for both single-scattering cases and for inverting dynamical diffraction.
[Topics of Interest]
• 4D-STEM data acquisition, processing and interpretation
• Measurement of electric and magnetic fields by 4D-STEM and DPC
• Fundamentals of the inverse problem in electron diffraction
• Ptychography approaches for single scattering
• Inverting dynamical scattering by ptychography
[Topics of Interest]
• 4D-STEM data acquisition, processing and interpretation
• Measurement of electric and magnetic fields by 4D-STEM and DPC
• Fundamentals of the inverse problem in electron diffraction
• Ptychography approaches for single scattering
• Inverting dynamical scattering by ptychography
Organizer : Knut Muller-Caspary
(Ludwig-Maximilians University)
10 September (Sun.), Full-day Workshop 09:00-15:30, BEXCO
This pre-congress workshop will focus on advances in time-resolved electron microscopy and new findings using the method. Studies on photonics, physical, chemical, and materials dynamics spanning attoseconds to microseconds and instrumentation for accessing those timescales are highly welcome. In addition to communicating instrumentation developments and the new scientific advances resulting from ultrafast (and fast, single-shot, and fast-frame) electron microscopy (transmission and scanning) experiments, a goal of this workshop is to stimulate discussions on future directions of time-resolved electrn microscopy and to foster the formation of new collaborations and new ideas within the relevant communities.
[Topics of Interest]
• Techniques and instrumentation for high-resolution (spatial and temporal) imaging, in stroboscopic, single-shot, an fast-frame modes.
• Scientific findings on structural, electronic, and magnetic dynamics enabled by using time-resolved electrn microscopy methods.
• Photonics under strong photon-electron interactions that has been enabled by ultra-brief optical and/or electron pulses, coherent control of quantum system, electron-state manipulation.
[Topics of Interest]
• Techniques and instrumentation for high-resolution (spatial and temporal) imaging, in stroboscopic, single-shot, an fast-frame modes.
• Scientific findings on structural, electronic, and magnetic dynamics enabled by using time-resolved electrn microscopy methods.
• Photonics under strong photon-electron interactions that has been enabled by ultra-brief optical and/or electron pulses, coherent control of quantum system, electron-state manipulation.
Organizer : Oh-Hoon Kwon
(Ulsan National Institute of Science & Technology, Republic of Korea)
Organizer : Hugo Lourenço-Martins
(CEMES - CNRS, France)
Workshop Program
Program Outline | ||||
09:00 - 10:30 | Session 1 | |||
Invited Speaker 1 | Ido | Kaminer | Israel Institute of Technology, Israel | (TBC) |
Invited Speaker 2 | Martin | Kozak | Charles University, Czech | (TBC) |
Invited Speaker 3 | Leon | Bruckner | Friedrich Alexander Universitat, Germany | (TBC) |
Invited Speaker 4 | Armin | Feist | Max Planck Institute for Multidisciplinary Sciences & University of Gottingen, Germany | (TBC) |
10:30 - 11:00 | Coffee Break | |||
11:00 - 12:30 | Session 2 | |||
Invited Speaker 1 | Jonas | Weissenrieder | KTH, Sweden | (TBC) |
Invited Speaker 2 | Chong-Yu | Ruan | Michigan State University, USA | (TBC) |
Invited Speaker 3 | Kyoko | Ishizaka | Tokyo University, Japan | (TBC) |
Invited Speaker 4 | Ye-Jin | Kim | Caltech, USA | (TBC) |
12:30 - 14:00 | Lunch | |||
14:00 - 15:30 | Session 3 | |||
Invited Speaker 1 | Florian | Banhart | University of Strasbourg, France | (TBC) |
Invited Speaker 2 | Ulrich | Lorenz | EPFL, Switzerland | (TBC) |
Invited Speaker 3 | Sascha | Schaffer | University of Regensburg, Germany | (TBC) |
10 September (Sun.), Full-day Workshop 09:00-17:30, BEXCO
Our understanding of the 3D structure and functional subtleties of complex biological systems has skyrocketed due to recent advances in EM imaging technology and hybrid methodologies. This symposium will highlight structural studies of macromolecules, microorganisms, cells, and tissues using state-of-the-art high-resolution techniques. These techniques include single particle cryo-EM, cryo-electron tomography, helical reconstruction, and molecular modeling. Biological topics of interest include cellular architecture, structure and function of memrane proteins, and structure and function of dynamic molecular machines.
[Topics of Interest]
• single particle cryo-EM
• cryo-Electron tomography
• Correlated Light and Electron Microscopy (CLEM)
• molecular modeling
[Topics of Interest]
• single particle cryo-EM
• cryo-Electron tomography
• Correlated Light and Electron Microscopy (CLEM)
• molecular modeling
Organizer : Melanie Ohi
(University of Michigan Life Sciences Institute, USA)
10 September (Sun.), Full-day Workshop 09:00-17:30, BEXCO
Super-resolution microscopy, a field awarded the Nobel Prize, has transformed the world of optical microscopy by overcoming the diffraction limit of light and enabling noninvasive observation of the nanoscale world. It includes stochastic optical reconstruction microscopy (STORM), photoactivated localization microscopy (PALM), structured illumination microscopy (SIM), and stimulated emission depletion (STED) microscopy. These techniques have been further developed through interdisciplinary advancements in optics, chemistry, and software, demonstrating improved imaging performance in spatial resolution and throughput. Super-resolution microscopy is now essential for discovering the nanoscale morphology of biological specimens, enabling new biological studies and applications. This workshop will bring together leaders in the super-resolution microscopy field to share and discuss its current status and future directions, providing valuable insights for both microscopy developers and users.
[Topics of Interest]
• Development of super-resolution microscopy techniques, including fluorescent probes and labeling strategies, optics and imaging systems, and image analysis and data processing
• Multimodal super-resolution microscopy techniques, including correlative imaging and spectroscopic imaging
• Super-resolution imaging of (live) cells, tissues, and other non-biological specimens
• Application of super-resolution microscopy, including protein interactions and dynamics, nanoscale morphology, disease mechanisms and drug discovery
[Topics of Interest]
• Development of super-resolution microscopy techniques, including fluorescent probes and labeling strategies, optics and imaging systems, and image analysis and data processing
• Multimodal super-resolution microscopy techniques, including correlative imaging and spectroscopic imaging
• Super-resolution imaging of (live) cells, tissues, and other non-biological specimens
• Application of super-resolution microscopy, including protein interactions and dynamics, nanoscale morphology, disease mechanisms and drug discovery
Organizer : Doory Kim
(Hanyang University, Republic of Korea)
Organizer : Jeongmin Kim
(Seoul National University, Republic of Korea)
10 September (Sun.), Half-day Workshop 09:00-12:30, BEXCO
Expansion microscopy (ExM) improves the resolution of fluorescence microscopy by physically expanding specimens using swellable hydrogels. This technique involves embedding specimens in a hydrogel and homogenizing them, followed by expansion in DI water. Since its first demonstration in 2015, ExM has been widely adopted to solve problems in various biological applications, including neuroscience, cancer, developmental biology, and even diagnostics. The workshop covers the basic molecular mechanism of ExM, examples of its use, differences between different hydrogel and anchoring chemistries, state-of-the-art expansion techniques, and practical considerations for implementing ExM.
[Topics of Interest]
• Various expansion microscopy chemistries and strategies
• Practical guidelines for the implementation of expansion microscopy
• State-of-the-art expansion microscopy techniques and their applications
• Application of expansion microscopy to diverse model systems, including C. Elegans, zebrafish, and mouse embryos
[Topics of Interest]
• Various expansion microscopy chemistries and strategies
• Practical guidelines for the implementation of expansion microscopy
• State-of-the-art expansion microscopy techniques and their applications
• Application of expansion microscopy to diverse model systems, including C. Elegans, zebrafish, and mouse embryos
Organizer : Jae-byum Chang
(Korea Advanced Institute of Science and Technology, Republic of Korea)
2
BEXCO Hands-on Workshops
10 September (Sun.), Full-day Workshop 09:00-17:30, BEXCO
This workshop aims to explore the basic principles of EBSD and TKD analysis techniques. Providing information about how the choice of analysis parameters effects the data, exploring considerations which should take place before data is being acquired in order to get good data in a time efficient manner. This is combined with application examples showing how EBSD & TKD can be effectively used in the different developing application areas.
[Topics of Interest]
• Introduction to EBSD and TKD
• The effect of SEM conditions and analysis parameters, how choices can affect the data.
• EBSD applications in Battery industry, Electronics industry and Materials Science
[Topics of Interest]
• Introduction to EBSD and TKD
• The effect of SEM conditions and analysis parameters, how choices can affect the data.
• EBSD applications in Battery industry, Electronics industry and Materials Science
Organizer : Kim Larsen
(Oxford Instruments NanoAnalysis, UK)
Organizer : Kunyong LEE
(Oxford Instruments Material Analysis Group, Republic of Korea)
Workshop Program
Program Outline | ||||
09:00 - 10:30 | Session 1 | |||
Invited Speaker 1 | Kim | Larsen | Oxford Instruments NanoAnalysis, UK | Introduction to EBSD and TKD |
10:30 - 11:00 | Coffee Break |
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11:00 - 12:30 | Session 2 |
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Invited Speaker 1 | Kim | Larsen | Oxford Instruments NanoAnalysis, UK | The effect of SEM conditions and analysis parameters, how choices can affect the data. |
12:30 - 14:00 | Lunch | |||
14:00 - 15:30 | Session 3 | |||
Invited Speaker 1 | (TBD) | Advanced EBSD Application | ||
Invited Speaker 2 | Kim | Larsen | Oxford Instruments NanoAnalysis, UK | EBSD applications I - in Battery industry, Electronics industry and Materials Science |
15:30 - 16:00 | Coffee Break | |||
16:00 - 17:30 | Session 4 | |||
Invited Speaker 1 | Kim | Larsen | Oxford Instruments NanoAnalysis, UK | EBSD applications II - in Battery industry, Electronics industry and Materials Science |
10 September (Sun.), Half-day Workshop 09:00-12:30, BEXCO
The workshop aims to introduce the basic theory of Raman spectroscopy and its applications in various fields. To aid in the attendees' understanding, we plan to share case studies from invited speakers and conduct a live Raman demonstration at the end of the workshop.
[Topics of Interest]
• 3D Raman Imaging & Correlative Microscopy techniques
• RISE Microscopy – Combining Chemical Imaging with Ultrastructural and Elemental Analysis
• Advances in Raman Imaging Tools and Spectral Data Evaluation – Showcase and Demo
[Topics of Interest]
• 3D Raman Imaging & Correlative Microscopy techniques
• RISE Microscopy – Combining Chemical Imaging with Ultrastructural and Elemental Analysis
• Advances in Raman Imaging Tools and Spectral Data Evaluation – Showcase and Demo
Organizer : Matthias Kress
(Oxford Instruments WITec, Germany)
Organizer : Kwangik Sung
(Oxford Instruments WITec, Republic of Korea)
Workshop Program
Program Outline | ||||
09:00 - 10:00 | Session 1 | |||
Invited Speaker 1 | Matthias | Kress | Oxford Instruments WITec, Germany | Wecome & Greeting |
Invited Speaker 2 | Jan | Enlert | Oxford Instruments WITec, Germany | 3D Raman Imaging & Correlative Microscopy techniques – An Introduction |
Invited Speaker 3 | (TBD) | |||
10:00 - 10:30 | Coffee Break |
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10:30 - 12:30 | Session 2 |
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Invited Speaker 1 | Matthias | Kress | Oxford Instruments WITec, Germany | RISE Microscopy – Combining Chemical Imaging with Ultrastructural and Elemental Analysis |
Invited Speaker 2 | (TBD) | |||
Invited Speaker 3 | Jan | Enlert | Oxford Instruments WITec, Germany | Advances in Raman Imaging Tools and Spectral Data Evaluation – Showcase and Demo |
10 September (Sun.), Half-day Workshop 14:00-17:30, BEXCO
SPM New Technology and Option Introduction & Hands-on Experience
SPM: Scanning Probe Microscopy
- PinPoint Mode
- Sideband KPFM
- DFRT PFM
- Lithography
SPM: Scanning Probe Microscopy
- PinPoint Mode
- Sideband KPFM
- DFRT PFM
- Lithography
Organizer : Sang-Joon Cho
(Park Systems Corp., Republic of Korea)
Chair : Yunseok Kim
(Sungkyunkwan University, Republic of Korea)
Chair : Sang Mo Yang
(Sogang University, Republic of Korea)
10 September (Sun.), Half-day Workshop 14:00-17:30, BEXCO
Atomic Force Microscopes (AFM) are capable of imaging samples with exceptionally high resolution. Atomic defects and the DNA double helix can both be resolved using advanced AFM systems. In this workshop, we will introduce attendees to AFM fundamentals, ultra-high resolution imaging, and advanced AFM modes. We will demonstrate ultra-high resolution AFM performance and ease of use on the Cypher ES Atomic Force Microscope.
[Topics of Interest]
• Atomic Force Microscopy (AFM) Fundamentals
• Ultra-High Resolution Imaging with AFM
• Advanced AFM Modes of Operation
[Topics of Interest]
• Atomic Force Microscopy (AFM) Fundamentals
• Ultra-High Resolution Imaging with AFM
• Advanced AFM Modes of Operation
Organizer : David BECK
(Oxford Instruments Asylum Research, UK(APAC))
Organizer : Jungwon KIM
(Oxford Instruments Asylum Research, Republic of Korea)
Chair : Yunseok Kim
(Sungkyunkwan University, Republic of Korea)
Chair : Sang Mo Yang
(Sogang University, Republic of Korea)
10 September (Sun.), Half-day Workshop 09:00-12:30, BEXCO
The workshop aims to introduce participants to a new generation of scientific microscopes called holotomography with insightful presentations covering the underlying technology, its technical development, and the advantages that make it a powerful tool to tackle current scientific challenges. Audiences will also be engaged in deeper discussions on a wide range of applications and be inspired to approach their research topics in practical ways.
The majority of microscopy techniques in live cell imaging limit the quantity and quality of information available to researchers, constrain the study of thicker specimens, and even harm the cells during long-term studies. Tomocube provides a ground-breaking solution to overcome these limitations, allowing work with confluent cell sheets, significantly reducing laser-induced speckle noise for enhanced contrast, delivering enhanced levels of fluorescence illumination, and enabling the study of thicker specimens. Tomocube’s high-resolution, high-sensitivity, high-throughput solution was designed to meet the growing demand for live cell imaging tools in the emerging fields of cell therapy, drug development, cell organelle analysis, etc.
The majority of microscopy techniques in live cell imaging limit the quantity and quality of information available to researchers, constrain the study of thicker specimens, and even harm the cells during long-term studies. Tomocube provides a ground-breaking solution to overcome these limitations, allowing work with confluent cell sheets, significantly reducing laser-induced speckle noise for enhanced contrast, delivering enhanced levels of fluorescence illumination, and enabling the study of thicker specimens. Tomocube’s high-resolution, high-sensitivity, high-throughput solution was designed to meet the growing demand for live cell imaging tools in the emerging fields of cell therapy, drug development, cell organelle analysis, etc.
3
Off-site Hands-on Workshops
9 September (Sat.), Full-day Workshop 09:00-17:30, Korea Brain Research Institute (Daegu)
Lightsheet technology has revolutionized fluorescence microscopy over the past two decades, allowing for fast and gentle volume imaging of living cells, organoids, plants, and embryos. The basic principle of lightsheet microscopy involves generating a thin sheet of light for sample illumination and decoupling the illumination and detection at a perpendicular geometry. This technique is particularly useful for imaging over extended periods, and its fast acquisition speed also makes it ideal for imaging large specimens, such as optically cleared brains, tissues, and entire animal models. To improve axial resolution, a lattice illumination pattern can be generated, which replaces the standard Gaussian beam and reduces light sheet thickness down to 550 nm. This lattice implementation opens up new avenues for isotropic volume imaging of living cells. One technical challenge of lightsheet microscopy is its inherent big data. Recent software solutions have been developed to address this challenge, offering 3D visualization and analysis of data in the terabytes range.
[Topics of Interest]
Hands-on station 1: Gaussian beam lighthsheet (ZEISS Lightsheet Z1)
Hands-on station 2: Lattice beam lightsheet (ZEISS Lattice Lightsheet 7)
Hands-on station 3: Big data handling (ZEISS arivis pro)
※ Round-trip shuttles (BEXCO Busan ↔ KBRI Daegu) and lunch will be provided for the attendees of this workshop.
[Topics of Interest]
Hands-on station 1: Gaussian beam lighthsheet (ZEISS Lightsheet Z1)
Hands-on station 2: Lattice beam lightsheet (ZEISS Lattice Lightsheet 7)
Hands-on station 3: Big data handling (ZEISS arivis pro)
※ Round-trip shuttles (BEXCO Busan ↔ KBRI Daegu) and lunch will be provided for the attendees of this workshop.
Organizer : Yongjae Kim
(ZEISS, Republic of Korea)
Organizer : Xianke Shi
(ZEISS, APAC)
Workshop Program
Program Outline | ||||
09:00 - 10:30 | Transfer to KBRI Daegu* | |||
10:30 - 11:30 | Presentation | |||
Presenter | BeeYi | Tan | ZEISS, APAC | Software solutions for big data visualization and 3D image analysis |
11:30 - 13:00 | Lunch | |||
13:00 - 14:00 | Hands-on Session 1 | |||
Operator | Gisu | Eom | ZEISS, Republic of Korea | Gaussian beam lighthsheet (ZEISS Lightsheet Z1) |
14:00 - 15:00 | Hands-on Session 2 | |||
Operator | Xianke | Shi | ZEISS, APAC | Lattice beam lightsheet (ZEISS Lattice Lightsheet 7) |
15:00 - 16:00 | Hands-on Session 3 | |||
Operator | BeeYi | Tan | ZEISS, APAC | Big data handling (ZEISS arivis pro) |
16:00 - 17:30 | Transfer to BEXCO Busan* |
9 September (Sat.), Full-day Workshop 09:00-17:30, KAIST (Daejeon)
Cryo-electron tomography (cryo-ET) combines the best possible structural preservation with nanometer-scale resolution. This method acquires 3D snapshots of the cellular interior and visualizes protein complexes within their crowded physiological environments. Such high-resolution 3D images of the cell interior provide new insights into cellular function and shed light on the arrangement and structure of native protein complexes. There is no longer just structural information; it is now linked to the spatial arrangement within a cell. This workshop will provide an opportunity to gain experience in instrument operation and include lectures providing theory and scientific applications of tomoraphy for structural biology.
[Topics of Interest]
• Cryo-ET : preparation, collection, reconstruction
• The latest Cryo-ET Trends
• Visualizing & Surface Rendering for Cryo-ET
※ Round-trip shuttles (BEXCO Busan ↔ KAIST Daejeon) and lunch will be provided for the attendees of this workshop.
[Topics of Interest]
• Cryo-ET : preparation, collection, reconstruction
• The latest Cryo-ET Trends
• Visualizing & Surface Rendering for Cryo-ET
※ Round-trip shuttles (BEXCO Busan ↔ KAIST Daejeon) and lunch will be provided for the attendees of this workshop.
Organizer : JaeKyung Hyun
(Pusan National University, Republic of Korea)
9 September (Sat.), Half-day Workshop 14:00-17:30, KAIST (Daejeon)
Innovative materials play essential roles in safety, clean energy, transportation, human health, and industrial productivity. To fuel continued innovation, researchers want to deepen their understanding of the physical and chemical properties of materials (morphological, structural, magnetic, thermal, and mechanical) from the macro- to nanoscale. Whether discovering new materials, solving analytical problems, improving processes, or assuring product quality, electron microscopy is capable of providing insight at all scales and modalities.
In this workshop, we'll focus on the latest Material Science research solution with TEM instrument, Spectra Ultra, to give you an overview of the recent trends of the research.
[Topics of Interest]
• The Latest in TEM Research
• Material Science TEM Research Solutions from Thermo Fisher Scientific
• TEM Sample Analysis with Spectra Ultra
※ Round-trip shuttles (BEXCO Busan ↔ KAIST Daejeon) and lunch will be provided for the attendees of this workshop.
In this workshop, we'll focus on the latest Material Science research solution with TEM instrument, Spectra Ultra, to give you an overview of the recent trends of the research.
[Topics of Interest]
• The Latest in TEM Research
• Material Science TEM Research Solutions from Thermo Fisher Scientific
• TEM Sample Analysis with Spectra Ultra
※ Round-trip shuttles (BEXCO Busan ↔ KAIST Daejeon) and lunch will be provided for the attendees of this workshop.
9 September (Sat.), Full-day Workshop 09:00-17:30, Korea Brain Research Institute (Daegu)
Hands-on session 1: Super-resolution confocal microscope system (Nikon AX R)
Hands-on session 2: Super-resolution live cell imaging system (Nikon N-SIM)
Hands-on session 3: Advanced software analysis (Nikon NIS ai)
Hands-on session 2: Super-resolution live cell imaging system (Nikon N-SIM)
Hands-on session 3: Advanced software analysis (Nikon NIS ai)
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A workshop is subject to cancellation if fewer than 10 registrants.
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Off-site Hands-on Workshops can have a maximum of 20 registrants per workshop.
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Please note for “Park SPM Workshop (Park Systems Corp.)” & “High resolution Imaging with the AFM (Oxford Instruments Korea)” will hold joined demonstrations if registrants for both workshops are less than 20 registrants.